Nova (Nasdaq: NVMI), a provider of metrology solutions for advanced process control used in semiconductor manufacturing, enters into a definitive agreement to acquire ancosys GmbH,…
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metrology
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NewsProduct Launch
Park Systems Introduces Powerful New Semiconductor Tool, Combines Atomic Force Microscopy with White Light Interferometry
by EC Editorby EC EditorThe manufacturer of Atomic Force Microscopes, Park Systems launches Park NX-Hybrid WLI, the first fully integrated system that combines Atomic Force Microscopy…