Nova’s (Nasdaq: NVMI) PRISM platform has been recently selected by another top integrated circuits (IC) manufacturer for its 3D NAND advanced nodes.
Nova PRISM was picked post an extensive evaluation period due to its superior metrology performance in critical applications enabled by the platform’s spectral interferometry (SI) technology. The SI technology adds a new dimension of spectral information not accessible by the current traditional optical CD methods.
The unique combination of proprietary hardware and advanced software enables Nova PRISM to measure in die complex 3D NAND high aspect ratio structures, which are critical to the performance and yield of such devices while uniquely separating the complex layers.
“This major selection by one of the world’s leading semiconductor manufacturers serves as further evidence of our innovative leadership and evolving position,” stated Eitan Oppenhaim, Nova’s president and CEO. “Furthermore, this showcases the value we bring to our customers by combining innovative hardware technologies with advanced software capabilities to solve highly complex challenges in advanced nodes to assist our customers in shortening development cycles and time to market. We are very encouraged by the traction this platform is gaining with multiple leading customers and expect further evaluations to materialize during the next few quarters.”
