proteanTecs, a leading provider of deep data analytics for advanced electronics, and ELES, a global semiconductor device reliability testing solutions provider, have announced a strategic partnership aimed at enhancing safety and mission-critical applications. This collaboration integrates proteanTecs’ Health and Performance Monitoring solutions with ELES’ Design for Reliability methodology and advanced reliability test platforms. Their joint efforts are outlined in a new white paper titled “Using Deep Data Analytics to Enhance Reliability Testing: The Fast Roadmap for Zero Defects.”
Traditional reliability testing procedures, often limited to pass/fail outcomes, can overlook critical effects. In response, proteanTecs and ELES have developed an innovative approach. Their collaboration incorporates parametric measurements during stress tests, allowing precise monitoring of real degradation effects. This approach enables smart material selection, dynamic stress level calibration, early identification of outliers, and rapid root cause analysis post-failure. These advancements enhance customer confidence in reliability and mission profiles, leading to significant time and cost savings.
Antonio Zaffarami, President of ELES, stated, “ELES’ Reliability Embedded Test Engineering methodologies, empowered by proteanTecs’ deep data analytics, enable clients to identify and remove device weaknesses, ensuring higher production yields and shorter time to market.”
Uzi Baruch, Chief Strategy Officer at proteanTecs, emphasized the significance of the collaboration. “By providing parametric visibility based on chip telemetry, we offer Quality and Reliability engineers increased confidence, enabling novel measurement techniques and predictability in reliability testing.”
